范德瓦尔斯力
光电子学
异质结
材料科学
物理
量子力学
分子
作者
Xiaoxiang Wu,Peng Li,Yu Wang,Yali Liu,Z.Z. Chen,Cong Xiao,Zhanjie Qiu,Tianjian Ou,Zhengyang Zhanyi,Feixiang Du,Zhongliang Wang,Songlin Zhou,Yewu Wang
摘要
van der Waals (vdW) heterojunctions hold significant promise for optoelectronic applications due to their high-quality interfaces and exceptional fabrication flexibility. In this study, lateral MoS2/GaTe vdW heterojunctions were fabricated, and their electronic and optoelectronic properties were thoroughly investigated. The devices, however, exhibited poor rectification behavior. Additionally, the electron-dominated conductivity indicates that electrons play a key role in the performance of the MoS2/GaTe vdW heterojunction device. To enhance device performance, the suppression of electron recombination was achieved by eliminating the non-heterojunction regions on the GaTe side, optimizing the device structure. Notably, a rectification ratio of 1 × 103 and an ideality factor of 1.58 were observed. The device also demonstrated self-driven photodetection performance under 532 nm laser irradiation, with a responsivity of 409.2 mA/W, a high-speed response/recovery time of 43.1/72.4 μs, and a high on/off ratio of 1.3 × 103. The results provide an effective strategy for optimizing and enhancing the performance of optoelectronic devices based on the vdW heterojunctions.
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