17.3: Work function reduction by multilayer oxides :Thermionic electron emission microscopy of scandium oxide and barium oxide on tungsten

In this paper, thick (200 nm) layers of reactively sputtered Sc2O3and BaO on tungsten (W) foil were examined. Thermionic electron emission microscopy (ThEEM) was used to image the surfaces during electron emission. Current vs. brightness temperature data were used to estimate the work function.