力谱学
范德瓦尔斯力
原子力显微镜
静电力显微镜
表面力
化学物理
纳米技术
表面力仪
溶剂化
显微镜
扫描力显微镜
化学
材料科学
作者
Fabien Gaboriaud,Yves F. Dufrêne
标识
DOI:10.1016/j.colsurfb.2006.09.014
摘要
In recent years, the physical properties and interaction forces of microbial cell surfaces have been extensively studied using atomic force microscopy (AFM). A variety of AFM force spectroscopy approaches have been developed for investigating native cell surfaces with piconewton (nanonewton) sensitivity and nanometer lateral resolution, providing novel information on the nanomechanical properties of cell walls, on surface forces such as van der Waals and electrostatic forces, solvation and steric/bridging forces, and on the forces and localization of molecular recognition events. The intention of this article is to survey these different applications and to discuss related methodologies (how to prepare tips and samples, how to record and interpret force curves).
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