单事件翻转
继电器
软错误
心烦意乱
故障注入
散裂中子源
事件(粒子物理)
中子
计算机科学
软件
可靠性工程
电子工程
散裂
工程类
计算机硬件
静态随机存取存储器
物理
核物理学
机械工程
功率(物理)
量子力学
程序设计语言
作者
Hualiang Zhou,Hao Yu,Zhiyang Zou,Zhantao Su,Q. Zhao,Yang Wu,Chaohui He
出处
期刊:Electronics
[MDPI AG]
日期:2023-12-22
卷期号:13 (1): 64-64
标识
DOI:10.3390/electronics13010064
摘要
Traditionally, studies have primarily focused on single event effects in aerospace electronics. However, current research has confirmed that atmospheric neutrons can also induce single event effects in China’s advanced technology relay protection devices. Spallation neutron irradiation tests on a Loongson 2K1000 system-on-chip based relay protection device have revealed soft errors, including abnormal sampling, refusal of operation and interlock in the relay protection device. Given the absence of standardized evaluation methods for single event effects on relay protection devices, the following research emphasizes the use of Monte Carlo simulation and software fault injection. Various types of single event upsets, such as single bit upsets, dual bit upsets, and even eight bit upsets, were observed in Monte Carlo simulations where atmospheric neutrons hit the chip from different directions (top and bottom). The simulation results indicated that the single event effect sensitivity of the relay protection device was similar whether the neutron hit from the top or the bottom. Through software fault injection, the study also identified soft errors caused by neutron induced single event upsets on the Loongson 2K1000 system, including failure to execute, system halt, time out, and error result. And the soft error number of system halts and error results exceeded that of time outs and failures to execute in all three tested programs. This research represents a preliminary assessment of single event effects on relay protection devices and is expected to provide valuable insights for evaluating the reliability of advanced technology relay protection devices.
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