制作
材料科学
蚀刻(微加工)
光电子学
氧化铟锡
晶体管
纳米技术
场效应晶体管
阈下斜率
阈下传导
薄膜晶体管
生物传感器
半导体
薄膜
图层(电子)
电气工程
电压
工程类
医学
病理
替代医学
作者
Ritsu Katayama,Toshiya Sakata
出处
期刊:ECS transactions
[Institute of Physics]
日期:2023-05-19
卷期号:111 (3): 37-43
被引量:2
标识
DOI:10.1149/11103.0037ecst
摘要
In this paper, we report on a novel and simple fabrication method for solution-gated thin-film indium tin oxide (ITO) channel field-effect transistors (FETs). These devices can be fabricated by etching a part of deposited conductive ITO film with about 100 nm thickness to 20 nm thickness as the channel, which exhibits semiconductor characteristics. The current measurement during etching enables the direct observation of the change in current at the channel, that is, the precise optimization of FET characteristics. The devices fabricated show a steep subthreshold slope (~80 mV/decade) and a large I d / I g ratio; thus, they have the potential to be applied in highly sensitive affordable biosensors.
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