表征(材料科学)
材料科学
电子断层摄影术
波长
光子学
断层摄影术
光学
纳米技术
光电子学
透射电子显微镜
扫描透射电子显微镜
物理
作者
Thabang R. Somo,Mpitloane J. Hato,Kwena D. Modibane
出处
期刊:Engineering materials
日期:2021-11-13
卷期号:: 87-111
被引量:5
标识
DOI:10.1007/978-3-030-85397-6_4
摘要
Macroporous materials (with pore sizes of > 50 nm) have received little attention in the literature mainly due to their complexity but their pore diameters comparable to optical wavelengths are predicted to have unique and highly useful optical properties such as photonic bandgaps and optical stop-bands. Herein, the current state of characterization of these materials using a set of three-dimensional imaging techniques: computerized X-ray tomography, 3D electron tomography, dual-beam electron microscopy and magnetic resonance imaging is discussed. Each technique could be characterized by ambiguities resulting from various parameters. Nevertheless, employing the above-mentioned techniques in parallel or even coupling them can improve their precision and eliminate ambiguities when characterizing macroporous materials.
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