可靠性(半导体)
逆变器
功率(物理)
点(几何)
选择(遗传算法)
电子工程
功率半导体器件
电气工程
可靠性工程
计算机科学
材料科学
工程类
物理
电压
数学
几何学
量子力学
人工智能
作者
Taerim Ryu,Ui‐Min Choi,Frede Blaabjerg
标识
DOI:10.1109/jestpe.2024.3396190
摘要
One of the major drawbacks of the neutral-point clamped (NPC) inverter is unequal power loss distribution among power devices, which leads to unequal thermal loadings. Therefore, certain power devices experience higher temperature stress, and thus, both the lifetime and power rating of the NPC inverter are limited by the most stressed power devices. In this article, a reliability-oriented asymmetric IGBT chip size selection method is proposed to balance the lifetimes among the power devices of the NPC inverter and also to assist the designer in achieving the necessary system-level lifetime requirements. The thermal distribution of the power devices is analyzed based on a 30 kW NPC inverter as a case study. Then, analytical power loss and thermal impedance models are derived. Finally, by using the derived models, the junction temperature of the power devices as a function of the chip size is discussed, and proper chip size is selected not only for an even temperature distribution at a fixed operating condition but also for a given target lifetime of the NPC inverter under specific mission profiles.
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