高电子迁移率晶体管
晶体管
材料科学
功率半导体器件
宽禁带半导体
光电子学
氮化镓
功率(物理)
电气工程
限制
工程物理
计算机科学
纳米技术
工程类
电压
物理
图层(电子)
机械工程
量子力学
摘要
As a wide bandgap semiconductor with high breakdown field, GaN is expected to outperform the incumbent Si technology for power switching applications. Advances in GaN epitaxial growth, device technology, and circuit implementations have resulted in high-performing power switches based on the GaN high electron mobility transistor (HEMT) structure. Demonstrated system benefits have validated the real value of GaN power switching technology. However, the full potential of GaN power switching technology is still far from being exploited. Various factors, including the size of electrodes and wiring, non-optimal E-field shaping, and substrate capacitive coupling, are limiting the performance of GaN HEMT power switches. Emerging device structures, such as, vertical transistors and multichannel superjunction transistors, have the potential to overcome some of those limitations, thereby bringing the performance benefits of the GaN power switching technology to a new level. Understanding the underlying physics is important to the success of the emerging device structures.
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