Research on Non-standard Transient Conduction Waveform Measurement of Automotive Low Voltage Electronic Components
作者
Deng-Yu Zhang,Shuai Hou,Yue Zhang,Li Jiang
出处
期刊:2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium日期:2021-07-26卷期号:16: 624-627
标识
DOI:10.1109/emc/si/pi/emceurope52599.2021.9559351
摘要
ISO 7637-2:2011 is the main standard for electrical transient conducted immunity test of automotive low-voltage electronic components. It provides signals of different strength and different parameters for manufacturers to verify product performance of their products. However, with the development of the automotive industry, more and more signals not included in ISO 7637-2:2011 have been found to affect automotive electrical and electronic components and threaten vehicle safety. Detailed analysis and elaboration of these non-standard signals has been provided in this paper, which can explain many vehicle failure problems during start-up, driving and parking.