衍射
电子衍射
电子
散射
平面的
电子显微镜
材料科学
凝聚态物理
热的
分子物理学
物理
化学物理
结晶学
光学
化学
量子力学
热力学
计算机图形学(图像)
计算机科学
作者
Flynn Walsh,Mingwei Zhang,Robert O. Ritchie,Mark Asta,Andrew M. Minor
出处
期刊:Science Advances
[American Association for the Advancement of Science]
日期:2024-08-02
卷期号:10 (31)
被引量:5
标识
DOI:10.1126/sciadv.adn9673
摘要
Diffuse intensities in the electron diffraction patterns of concentrated face-centered cubic solid solutions have been widely attributed to chemical short-range order, although this connection has been recently questioned. This article explores the many nonordering origins of commonly reported features using a combination of experimental electron microscopy and multislice diffraction simulations, which suggest that diffuse intensities largely represent thermal and static displacement scattering. A number of observations may reflect additional contributions from planar defects, surface terminations incommensurate with bulk periodicity, or weaker dynamical effects.
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