六方氮化硼
从头算
材料科学
六方晶系
碳纤维
计算化学
硼
从头算量子化学方法
氮化硼
氮化物
化学物理
纳米技术
结晶学
化学
有机化学
复合材料
分子
石墨烯
图层(电子)
复合数
作者
Ao Wu,Danis I. Badrtdinov,Woncheol Lee,Malte Rösner,Cyrus E. Dreyer,Maciej Koperski
标识
DOI:10.1016/j.mtsust.2024.100988
摘要
The functionalities activated by defect centers in solids are constantly growing, opening new avenues for sustainable future technologies. These may extend to quantum optoelectronics if suitable defect centers are created and their properties understood. Recent progress in developing quantum emitters in hexagonal boron nitride (hBN) associated with carbon impurities enabled the realization of such concepts in atomically thin films, where the defect centers exhibit an unprecedented level of sensitivity toward the environment. The complexity of defects, together with new control knobs provided by van der Waals technology, poses a challenge for theory to accurately predict the properties of defect centers and to match them with experimental results. Here, we review the ab initio methods applied to carbon-containing defect centers in hBN, exploring the predictive capabilities of different levels of theory for their structural and optoelectronic properties.
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