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Design and analytical modeling of high-performance mid-wavelength infrared photodetectors: an nBn architecture

光电探测器 暗电流 光电子学 三元运算 异质结 超晶格 材料科学 带隙 红外线的 红外探测器 凝聚态物理 光学 物理 计算机科学 程序设计语言
作者
Rohit Kumar,Bhaskaran Muralidharan
标识
DOI:10.1117/12.3000313
摘要

Due to the instability of the conventional Hg1-xCdxTe alloy, the demand for barrier-based superlattice device structures for next-generation infrared photodetectors is rapidly growing. InAs1-xSbx, a Ga-free III–V ternary alloy, has the potential to show an advancement in the development of fourth-generation mid-wavelength infrared detectors. In this work, we develop an analytical, reliable simulation model to predict the dark current behavior of an nBn photodetector at various conditions and explain the physics of this new device structure to understand the operation of back-illuminated nBn photodetectors quantitatively. To provide the best possible performance, we consider InAs1-xSbx ternary alloy to design the absorber region due to its band gap tunability with Sb molar composition and favorable absorption characteristics. In order to complete the device design, InAsSb is used as a contact layer, and a lattice-matched, large-bandgap barrier layer of AlInAsSb is employed with the intent of minimizing diffusion current, depletion-region Shockley-Read-Hall (SRH) generation and leakage current in such devices. To construct the band structure of the considered heterostructure, we first determine the hole quasi-Fermi-level outside of the thermal equilibrium by solving the coupled equations for the electrostatic, carriers' current continuity, and Poisson equations. Finally, we calculate the current-voltage characteristics to gain insight into the dominant mechanisms in the generation of dark current and demonstrate how the radiative and non-radiative processes affect the performance in relation to temperature and applied bias. In addition, we shed light on the performance of the considered photodetector by varying the depth of the contact and absorber regions. Our findings from the current device design show that the InAsSb/AlInAsSb-based nBn architecture may be a promising alternative for achieving high performance using a simplified device structure while circumventing issues related to the conventional material system, thereby serving as a basis for next-generation infrared detectors.
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