NMOS逻辑
PMOS逻辑
逆变器
CMOS芯片
晶体管
材料科学
电气工程
光电子学
电压
MOSFET
栅氧化层
工程类
作者
G. Zimmer,H.L. Fiedler,B. Hoefflinger,E. Neubert,H. Vogt
出处
期刊:Electronics Letters
[Institution of Engineering and Technology]
日期:1981-09-03
卷期号:17 (18): 666-667
被引量:8
摘要
A scaled n-well CMOS technology with 40 nm gate oxide, 1 μm PMOS and 2 μm NMOS transistors has been realised with peak effective mobilities of 710 and 260 cm2V−1s−1 for electrons and holes, respectively, and available voltage gains as high as 80 for a 1 μm PMOS and 115 for a 2 μm NMOS transistor. The corresponding maximum inverter gain was 75. The inverter supply voltage range was 1.5 to 12 V and the inverter delay time was 300 ps at 5 V supply voltage.
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