可靠性(半导体)
休克(循环)
泊松过程
过程(计算)
计算机科学
仿射变换
班级(哲学)
可靠性工程
财产(哲学)
应用数学
泊松分布
数学优化
数学
人工智能
工程类
统计
物理
内科学
哲学
功率(物理)
操作系统
认识论
纯数学
医学
量子力学
作者
Lirong Cui,Zhenlu Chen,Hongda Gao
标识
DOI:10.1080/16843703.2016.1264146
摘要
In the paper, the concept of self-healing effects, permanent or limited duration on system health, is introduced by building a class of cumulative damage shock models in terms of the integral for counting processes including Poisson process, Hawkes process and Affine process, and so on. Based on the established shock models, the property on lifetime and the bounds of system reliability are discussed, especially for the simplest case. Then the general simulation algorithm is given for the general situation under the given cumulative damage shock models, because it is impossible to present the general analytical results on the reliability of systems. Some numerical examples are given to illustrate the algorithm and bounds of reliability. Finally, the whole works in the paper are concluded.
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