Scanning probe microscopy

Scanning probe microscopy (SPM) is based upon a probing tip, which is scanned across surfaces. The interactions between tip and sample are used to regulate the distance and acquire maps of topography with high lateral resolution. In addition, local information about a variety of physical and chemical properties can be gained. The most common methods of SPM are discussed, including scanning tunneling microscopy (STM) and atomic force microscopy (AFM).