LADA methodologies to localize embedded memory failure

Bitmap tool is commonly used by semiconductor design house to debug embedded memory failure as it is able to localize down to bit cell resolution with faster turnaround time as compared to hardware fault isolation methods. However, bitmap enablement requires tedious effort and high cost as it requires accurate logical-to-physical address scrambling information from memory IP provider to be successful. In this work, usage of hardware-based LADA fault isolation technique to debug system-on-chip (SOC) memory failure is discussed in term of implementation difficulty and success rate.