拉曼光谱
碳纤维
陶瓷
聚合物
材料科学
硅
度量(数据仓库)
纳米技术
化学工程
分析化学(期刊)
化学
复合材料
计算机科学
光电子学
有机化学
光学
复合数
数据挖掘
物理
工程类
作者
Tao Jiang,Yansong Wang,Yiguang Wang,Nina Orlovskaya,Linan An
标识
DOI:10.1111/j.1551-2916.2009.03233.x
摘要
Nanosized carbon clusters self‐formed in polymer‐derived ceramics (named free carbon) play a key role in determining the properties of the materials. However, it is difficult to quantitatively measure the concentration of the free carbon. Lack of this information restricts the understanding of the properties of the materials. In this paper, we report a Raman spectroscopy‐based quantitative method to measure the free carbon concentration by using silicon as an external reference. We demonstrate that the technique provides a simple and reliable way for the carbon content quantification.
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