Method for 3D profilometry measurement based on contouring moire fringe

3D shape measurement is one of the most active branches of optical research recently. A method of 3D profilometry measurement by the combination of Moire projection method and phase-shifting technology based on SCM (Single Chip Microcomputer) control is presented in the paper. Automatic measurement of 3D surface profiles can be carried out by applying this method with high speed and high precision.