静态随机存取存储器
CMOS芯片
能量(信号处理)
电气工程
计算机科学
电子线路
功率(物理)
物理
计算机硬件
工程类
量子力学
作者
Jinn-Shyan Wang,Chien‐Tung Liu,Yu-Chuan Hou
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2025-01-03
卷期号:60 (8): 3043-3052
被引量:3
标识
DOI:10.1109/jssc.2024.3520631
摘要
Conventional low-voltage (LV) static random access memories (SRAMs) utilizing separate read-and-write assist circuits sacrifice access speed too much, leading to poor energy efficiency. Overlaying additional assist circuits to enable power-saving modes can exacerbate speed loss and energy inefficiency. This work proposes a coordinated read-write-hold-retention-shutdown (SD) assist circuit design for SRAMs to improve speed at low VDD and reduce leakage current in active and power-saving modes. This leads to overall power reduction and enhanced energy efficiency. The implemented 22-nm 256-Kb SRAM can operate down to 0.45 V, with the minimum energy point at 0.5 V. At 0.5 V, TT corner, and 25 $^{\circ}$ C, the measured maximum frequency ( $f_{\text{max}}$ ) is 125 MHz with a 10 aJ/bit active energy, representing a 6.25 higher frequency with a 91% energy reduction, compared to the state-of-the-art 0.5-V SRAM in 28-nm bulk CMOS. The SRAM has a 12 pW/bit deep-sleep power and a 10 pW/bit SD power at 0.5 V.
科研通智能强力驱动
Strongly Powered by AbleSci AI