硫族元素
光致发光
材料科学
拉曼光谱
单层
空位缺陷
X射线光电子能谱
退火(玻璃)
激子
硫黄
二硫化钼
钝化
分析化学(期刊)
结晶学
化学
纳米技术
光电子学
凝聚态物理
核磁共振
图层(电子)
光学
物理
色谱法
冶金
复合材料
作者
Yiru Zhu,Juhwan Lim,Zhepeng Zhang,Yan Wang,Soumya Sarkar,Hugh Ramsden,Yang Li,Han Yan,Dibya Phuyal,Nicolas Gauriot,Akshay Rao,Robert L. Z. Hoye,Goki Eda,Manish Chhowalla
出处
期刊:ACS Nano
[American Chemical Society]
日期:2023-07-07
卷期号:17 (14): 13545-13553
被引量:95
标识
DOI:10.1021/acsnano.3c02103
摘要
Atomic defects in monolayer transition metal dichalcogenides (TMDs) such as chalcogen vacancies significantly affect their properties. In this work, we provide a reproducible and facile strategy to rationally induce chalcogen vacancies in monolayer MoS2 by annealing at 600 °C in an argon/hydrogen (95%/5%) atmosphere. Synchrotron X-ray photoelectron spectroscopy shows that a Mo 3d5/2 core peak at 230.1 eV emerges in the annealed MoS2 associated with nonstoichiometric MoSx (0 < x < 2), and Raman spectroscopy shows an enhancement of the ∼380 cm-1 peak that is attributed to sulfur vacancies. At sulfur vacancy densities of ∼1.8 × 1014 cm-2, we observe a defect peak at ∼1.72 eV (referred to as LXD) at room temperature in the photoluminescence (PL) spectrum. The LXD peak is attributed to excitons trapped at defect-induced in-gap states and is typically observed only at low temperatures (≤77 K). Time-resolved PL measurements reveal that the lifetime of defect-mediated LXD emission is longer than that of band edge excitons, both at room and low temperatures (∼2.44 ns at 8 K). The LXD peak can be suppressed by annealing the defective MoS2 in sulfur vapor, which indicates that it is possible to passivate the vacancies. Our results provide insights into how excitonic and defect-mediated PL emissions in MoS2 are influenced by sulfur vacancies at room and low temperatures.
科研通智能强力驱动
Strongly Powered by AbleSci AI