铼
灵敏度(控制系统)
核磁共振
磁场
霍尔效应传感器
凝聚态物理
分辨率(逻辑)
材料科学
物理
磁铁
计算机科学
工程类
冶金
电子工程
量子力学
人工智能
标识
DOI:10.5757/asct.2023.32.2.41
摘要
Absolute Hall-effect sensitivity (S A ) and minimum magnetic resolution (B min ) of two-dimensional (2D) van der Waals Hall elements are predicted without magnetic fields by considering the drain voltage-dependent transconductance and current power spectrum density (PSD).The measured drain-bias-dependent PSD of rhenium disulfide multilayers is suitably described by the carrier number fluctuation noise model, indicating that the effects of carrier trapping/de-trapping into oxide traps dominate the observed current variations.To achieve high currentnormalized Hall sensitivity and S A with a low B min at a specific current value, the contact resistance and oxide trap density should be further optimized.Our discussion provides an effective approach for the optimization of 2D multilayer-based Hall elements.
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