材料科学
俄歇电子能谱
薄膜
兴奋剂
热稳定性
溅射沉积
晶粒生长
退火(玻璃)
蓝宝石
晶界
光电子学
溅射
粒度
化学工程
复合材料
光学
纳米技术
微观结构
物理
工程类
核物理学
激光器
作者
Chadrasekhar Loka,Kwang Lee,Sin Yong Joo,Kee‐Sun Lee
标识
DOI:10.1088/2053-1591/aab072
摘要
Thermally stable, high reflectance thin film coatings are indispensable in optoelectronic devices, especially as a potential back reflector for LEDs and solar cells. The silver has the drawback of agglomerating easily and poor thermal stability, which is limiting its application as a highly reflective coating in various optoelectronic applications. In this study, improved thermal stability by modification of the Ag film into an Ag/Al-doped Ag structure has been confirmed. In this paper, the surface morphology, optical reflectance, and thermal stability of the Ag/Al-doped Ag are investigated. The Ag/Al-doped Ag/sapphire films showed excellent thermal stability after annealing the films at 523 K with the highest reflectance about ∼86% as compared to the pure Ag films. The grain growth analysis results revealed that the Al-doping is effective to restrain the severe grain growth of silver films. The Auger electron spectroscopy results revealed that the outer diffusion of aluminum and the formation of Al-O bond at the outermost silver layer which is beneficial to retard the Ag grain growth.
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