Real‐time and in situ monitoring of organosilicon‐induced thiram penetration into cabbage leaves by surface‐enhanced Raman scattering mapping

Abstract BACKGROUND Understanding pesticide penetration behavior is important for effective application of pesticides. However, there is a lack of an effective method to monitor pesticide penetration behavior and its changing process. In the present study, a novel surface‐enhanced Raman scattering (SERS) mapping method was used for real‐time and in situ tracking of the penetration behaviors of thiram and thiram–organosilicon mixture on cabbage leaves. RESULTS The results suggest that thiram has very weak ability to penetrate into cabbage leaves. However, when the thiram–organosilicon mixture was placed on leaf surfaces, a clear thiram signal was detected inside the leaf after 2 h of exposure, a strong signal was observed after 12 h, and the penetration depth of thiram was approximately 200 μm after 48 h. CONCLUSION SERS mapping was demonstrated to be a reliable method for in situ monitoring of organosilicon‐induced thiram penetration into cabbage leaf over time. The present study provides a new reference for rationally selecting adjuvants, effectively applying pesticides, and reducing pesticides residue in food. © 2022 Society of Chemical Industry.