卤化物
开尔文探针力显微镜
碱金属
二价
材料科学
显微镜
杂质
离子
图层(电子)
导电原子力显微镜
扫描力显微镜
原子力显微镜
分析化学(期刊)
化学
光学
纳米技术
无机化学
物理
有机化学
冶金
色谱法
作者
Clemens Barth,Claude R. Henry
标识
DOI:10.1103/physrevlett.98.136804
摘要
In this Letter we consider the surface double layer on (001) surfaces of UHV cleaved and annealed alkali halide crystals (KCl, NaCl), which we studied with dynamic scanning force microscopy and Kelvin probe force microscopy. Kelvin images show bright and round patches at corner sites and steps. Images with atomic resolution always show kinks at the latter step sites. Our findings are in perfect agreement with the long-standing picture that, due to the presence of divalent impurity ions, the surface carries a net negative surface charge originating from negative cation vacancies at kinks.
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