Kapton
聚酰亚胺
材料科学
辐照
抗辐射性
辐射
质子
电子
光电效应
光子
吸收(声学)
紫外线
复合材料
光电子学
光学
核物理学
物理
图层(电子)
作者
E. Plis,Daniel P. Engelhart,Russell Cooper,W. R. Johnston,Dale C. Ferguson,Ryan Hoffmann
出处
期刊:Applied sciences
[Multidisciplinary Digital Publishing Institute]
日期:2019-05-16
卷期号:9 (10): 1999-1999
被引量:96
摘要
Polyimide (PI, Kapton-H®) films are widely utilized in the spacecraft industry for their insulating properties, mechanical durability, light weight, and chemical resistance to radiation. Still PI materials remain exposed to a combination of high-energy electrons, protons, and ultraviolet (UV) photons, particles primarily responsible for radiation-induced damage in geosynchronous Earth orbit (GEO), which drastically change PI’s properties. This work reviews the effect of electron, proton, and UV photon irradiation on the material properties (morphology, absorption, mechanical properties, and charge transport) of PI. The different damaging mechanisms and chemical consequences that drive changes in the material properties of PI caused by each individual kind of irradiation will be discussed in detail.
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