极紫外光刻
喷射(流体)
体积热力学
材料科学
惰性气体
平版印刷术
激光器
气体压力
光电子学
光学
机械
物理
原子物理学
地质学
热力学
石油工程
作者
I. S. Abramov,С. В. Голубев,E. D. Gospodchikov,A. G. Shalashov,A. A. Perekalov,A. N. Nechay,Н. И. Чхало
标识
DOI:10.1103/physrevapplied.23.024004
摘要
A discharge with multiply charged ions of a noble gas supported by a powerful infrared laser in a high-pressure jet is considered as a source of extreme ultraviolet (EUV) light radiation in particular narrow bands demanded by next-generation lithography. In a proof-of-principle experiment in krypton, the EUV-emitting region is visualized using a dedicated EUV microscope. Measurements support a basic model of underlying physics that involves expansion of the emitting plasma outside the laser focus. In simulations, we show that using the xenon jet, more optimal for EUV emission, may provide an efficiency competitive to the best commercial EUV sources for lithography.
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