响应度
APDS
材料科学
光电探测器
光电子学
异质结
外延
雪崩光电二极管
光电效应
半导体
雪崩击穿
硅光电倍增管
光学
电压
探测器
击穿电压
纳米技术
电气工程
物理
图层(电子)
闪烁体
工程类
作者
Ning Li,Qingyi Zhang,Yongtao Yang,Yuanjun Tang,Tao Zhang,Jiaying Shen,Yuehui Wang,Fan Zhang,Yang Zhang,Zhenping Wu
标识
DOI:10.3788/col202321.051604
摘要
Ga2O3-based avalanche photodetectors (APDs) have gained increasing attention because of their excellent photoelectric conversion capability in the UV solar-blind region. Integrating high-quality epitaxial Ga2O3 with p-type semiconductor remains an open challenge associated with the integration difficulty on alleviating its defects and dislocations. Herein, we construct an APD consisting of epitaxial β-Ga2O3/La0.8Ca0.2MnO3 heterostructure. The pn junction APDs exhibit a high responsivity of 568 A/W as well as an enhanced avalanche gain of up to 3.0×105 at a reverse bias voltage of 37.9 V. The integration capability demonstrated in this work provides exciting opportunities for further development of high-performance Ga2O3-based electronics and optoelectronics.
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