扫描隧道显微镜
光谱学
扫描隧道光谱
约瑟夫森效应
电化学扫描隧道显微镜
材料科学
约瑟夫森相位
量子隧道
光电子学
皮约瑟夫森结
显微镜
纳米技术
凝聚态物理
物理
超导电性
光学
量子力学
作者
Margaret Fortman,David C. Harrison,R. Rodriguez,Zachary J. Krebs,Sangjun Han,Min Seok Jang,R. McDermott,Çaǧlar Girit,Victor W. Brar
出处
期刊:Cornell University - arXiv
日期:2024-10-03
标识
DOI:10.48550/arxiv.2410.03009
摘要
Josephson junction spectroscopy is a powerful local microwave spectroscopy technique that has promising potential as a diagnostic tool to probe the microscopic origins of noise in superconducting qubits. We present advancements toward realizing Josephson junction spectroscopy in a scanning geometry, where the Josephson junction is formed between a superconducting sample and a high capacitance superconducting STM tip. Data from planar Nb-based Josephson junction devices first demonstrate the benefits of including a high capacitance shunt across the junction, which decreases linewidth and improves performance at elevated temperatures. We show how an equivalent circuit can be implemented by utilizing a planarized STM tip with local prominences, which are fabricated via electron beam lithography and reactive ion etching, followed by coating with a superconducting layer. Differential conductance measurements on a superconducting NbN surface demonstrate the ability of these high capacitance tips to decrease both thermal noise and P(E)-broadening in comparison to typical wire tips.
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