Hot-carrier Separation Induced by the Electric Field of a p-n Junction between Titanium Dioxide and Nickel Oxide

We fabricated a p-type nickel oxide (NiO)/gold nanoparticle (Au-NP)/n-type titanium dioxide (TiO2) structure in which Au-NPs are placed in the p-n junction of TiO2 and NiO. The photoelectric properties of NiO/Au-NPs/TiO2 suggest that the main driving force of the hole separation from Au-NPs to NiO is the local electric field of the depletion layer of the p-n junction of TiO2 and NiO rather than the Schottky junction of Au and NiO. The plasnonic structure of p-type nickel oxide (NiO)/gold nanoparticle (Au-NP)/n-type titanium dioxide (TiO2) in which Au-NPs are placed in the p-n junction was fabricated. The photoelectric properties suggest that the main driving force of the hole separation from Au-NPs to NiO is the local electric field of the depletion layer of the p-n junction of TiO2 and NiO.