Key failure modes of solder joints on ENIG PCBs and root cause analysis

焊接 可焊性 材料科学 表面贴装技术 电镀(地质) 润湿 冶金 印刷电路板 表面光洁度 电子包装 复合材料 工程类 地质学 地球物理学 电气工程
作者
Bin Yao,Yabing Zou
标识
DOI:10.1109/icept-hdp.2012.6474823
摘要

The plating system of electroless nickel immersion gold (ENIG) has been widely used to finish solder pads of printed circuit boards (PCBs). The most attractive advantage of ENIG over other finishes is that it can be applied to fine-pitch assemblies such as BGAs, for superior surface mount component placement and solderability because of its coplanarity. ENIG is used by many board shops and is an established process. But recently many problems occur in ENIG solder joints. The worst cases are BGA package solder joint failures during the surface mount assembly process, or in the product's final use by a consumer. Based on the authors' long-term experience of solder joints failure analysis, two kinds of key failure modes for ENIG solder joints were found. One was poor wetting (non-wetting or de-wetting) of the solder to the ENIG surface finish on PCB pads during soldering process, and the other one was solder joint crack or separation from the nickel layer surface, causing an electrical open. At the same time, several typical solder joint failure cases were used to show how the two kinds of failure modes occurred. SEM was used to reveal more details of the microstructure of ENIG plated pad surface and the fracture at the interface between solder and metal pad. The plating composition and phosphorous (P) content were determined by EDX analysis. Additionally the failure mechanisms were investigated. The root cause for poor wetting was the poor solderability of corroded Ni layer which was the result of galvanic hyper-corrosion of the plated electroless Ni by the Au plating bath. For solder joint crack, the reason was the weak bonding due to P-rich layer resulted from Ni depletion at the surface from IMC formation. Finally, in order to prevent the two kinds of key failure modes, several suggestions were given.
最长约 10秒,即可获得该文献文件

科研通智能强力驱动
Strongly Powered by AbleSci AI
科研通是完全免费的文献互助平台,具备全网最快的应助速度,最高的求助完成率。 对每一个文献求助,科研通都将尽心尽力,给求助人一个满意的交代。
实时播报
刚刚
1秒前
雨灵发布了新的文献求助10
1秒前
大个的应助被凌亚楠采纳,获得10
2秒前
2秒前
2秒前
合适的自行车完成签到 ,获得积分10
3秒前
Yio完成签到 ,获得积分10
3秒前
斯文败类的应助被Pluto采纳,获得10
3秒前
5秒前
5秒前
5秒前
柴泽邦完成签到 ,获得积分10
5秒前
6秒前
6秒前
6秒前
7秒前
xiangyang发布了新的文献求助10
8秒前
找点东西完成签到,获得积分10
8秒前
8秒前
9秒前
zhou发布了新的文献求助10
10秒前
ergatoid发布了新的文献求助10
10秒前
duonicola完成签到,获得积分10
10秒前
11秒前
11秒前
CodeCraft的应助被雨灵采纳,获得10
12秒前
火星上如花完成签到,获得积分10
12秒前
周林分完成签到,获得积分10
13秒前
13秒前
14秒前
0994完成签到 ,获得积分10
14秒前
14秒前
啊发发布了新的文献求助10
15秒前
酷波er的应助被Franklin采纳,获得10
15秒前
汉堡包的应助被Hana采纳,获得10
15秒前
科研通AI6.4的应助被zhdjk采纳,获得10
16秒前
Vivi发布了新的文献求助10
17秒前
mor完成签到 ,获得积分10
17秒前
caizhiwei发布了新的文献求助10
18秒前
高分求助中
(应助此贴封号)【重要!!请各用户(尤其是新用户)详细阅读】【科研通的精品贴汇总】 10000
Rosenblum, Global Change Biology 800
自動車の空力技術 800
Organizational Behavior 510
Management and the Arts 510
Geschichtliche Grundbegriffe (GGB), Band 5: Pro–Soz 300
Die Religion in Geschichte und Gegenwart (RGG), 4. Auflage, Band 7: R–S 300
热门求助领域 (近24小时)
化学 材料科学 医学 生物 纳米技术 计算机科学 化学工程 工程类 有机化学 物理 复合材料 生物化学 内科学 细胞生物学 基因 遗传学 免疫学 冶金 光电子学 癌症研究
热门帖子
关注 科研通微信公众号,转发送积分 7790599
求助须知:如何正确求助?哪些是违规求助? 9328190
关于积分的说明 20421237
捐赠科研通 7380233
什么是DOI,文献DOI怎么找? 3323156
关于科研通互助平台的介绍 2470977
邀请新用户注册赠送积分活动 2339989