氧化物
结晶
阳极氧化
材料科学
电介质
等效氧化层厚度
化学工程
介电强度
复合材料
电气工程
栅氧化层
冶金
光电子学
铝
工程类
电压
晶体管
作者
Mariana de Souza Sikora,Jürgen Carstensen,H. Föll,Ernesto C. Pereira
出处
期刊:Current Nanoscience
[Bentham Science Publishers]
日期:2015-04-26
卷期号:11 (3): 263-270
被引量:11
标识
DOI:10.2174/1573413711666150212234928
摘要
Sparks are frequently observed during dielectric breakdown on valve metal oxide films, and several papers investigated their correlation with the oxide crystallization. In this work, the effect of high temperature of a spark was studied using finite element method. An important result is that the oxide area heated above the oxide fusion temperature is more than 50 times larger than the diameter of the channel generated during the breakdown event, meaning that just a few numbers of sparks could lead to a large area of oxide crystallization. Besides, the heated area is proportional to the spark temperature and to the oxide thickness. Finally, using a factorial design, a cross effect was also detected between the channel temperature and the barrier oxide thickness.
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