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Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection

互连 炸薯条 芯片级封装 成套系统 电子工程 工程类 嵌入式系统 电气工程 材料科学 光电子学 电信
作者
John Knickerbocker,Paul Andry,L.P. Buchwalter,A. Deutsch,R. Horton,K.A. Jenkins,Young Kwark,Gerard McVicker,C.S. Patel,R. Polastre,Christian Schuster,A. Sharma,Sri M. Sri-Jayantha,C.W. Surovic,Cornelia Tsang,Bucknell C. Webb,S. L. Wright,S. R. McKnight,E. Sprogis,B. Dang
出处
期刊:IBM journal of research and development [IBM]
卷期号:49 (4.5): 725-753 被引量:236
标识
DOI:10.1147/rd.494.0725
摘要

System-on-Package (SOP) technology based on silicon carriers has the potential to provide modular design flexibility and high-performance integration of heterogeneous chip technologies and to support robust chip manufacturing with high-yield/low-cost chips for a wide range of two- and three-dimensional product applications. Key technology enablers include silicon through-vias, high-density wiring, high-I/O chip interconnection, and supporting test and assembly technologies. The silicon through-vias are a key feature permitting efficient area array signal, power, and ground interconnection through these thinned silicon packages. High-density wiring and high-density chip I/O interconnection can enable tight integration of heterogeneous chip technologies which approximate the performance of an integrated system-on-chip with a "virtual chip" using the silicon package for integration. Silicon carrier fabrication leverages existing manufacturing capability and mid-UV lithography to provide very dense package wiring following CMOS back-end-of-line design rules. Further, the thermal expansion of the silicon carrier package matches the chip, which helps maintain reliability even as the high-density chip microbump interconnections scale to smaller size. In addition to heterogeneous chip integration, SOP products may leverage the integration of passive components, active devices, and electro-optic structures to enhance system-level performance while also maintaining functional test capability and known good chips when needed. This paper describes the technical challenges and recent progress made in the development of silicon carrier technology for potential new applications.
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