XPS and XRD studies of supported Pd-Cu bimetallics

XPS and XRD have been used to characterize carbon- and alumina-supported Pd-Cu bimetallic samples. Addition of Cu to supported Pd results in peak shifts in both XPS and XRD which are thought to be due to Pd-Cu bimetallic formation. The shift in the XPS Cu2p32 peak has been used to estimate the relative composition of the Pd-Cu bimetallic particles. The estimated composition of the bimetallic particles was found to be directly related to the nominal Pd and Cu metal loading levels.