半最大全宽
衍射
穿透深度
变形(气象学)
材料科学
研磨
光学
渗透(战争)
复合材料
物理
数学
光电子学
运筹学
作者
Anirban Naskar,S. Paul
标识
DOI:10.1016/j.ndteint.2021.102592
摘要
The present research work proposes a non-destructive methodology to detect and measure subsurface deformation using Grazing incidence X-ray diffraction (Gi-XRD). The FWHM of the XRD peak that indicates the degree of plastic deformation was measured at different X-ray penetration depths by changing the angle of incidence during Gi-XRD. However, these FWHM values do not represent the actual FWHM at a particular depth because it also captures the effect of the top layers. Therefore, the FWHM values were further analysed to get the actual FWHM for a particular penetration depth and correlated with the deformation depth. The non-destructively measured deformed layer thickness was verified against the results of the metallographic study and a deviation of around 1.2 μm was recorded.
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