光学
太赫兹辐射
显微镜
太赫兹光谱与技术
材料科学
近场扫描光学显微镜
相(物质)
摄影术
相位成像
光学显微镜
衍射
物理
扫描电子显微镜
量子力学
作者
Maria Caterina Giordano,Stefan Mastel,Clemens Liewald,Lorenzo Columbo,Massimo Brambilla,Leonardo Viti,Antonio Politano,Kai Zhang,Lianhe Li,A. G. Davies,E. H. Linfield,Rainer Hillenbrand,F. Keilmann,Gaetano Scamarcio,Miriam S. Vitiello
出处
期刊:Optics Express
[Optica Publishing Group]
日期:2018-07-03
卷期号:26 (14): 18423-18423
被引量:88
摘要
At terahertz (THz) frequencies, scattering-type scanning near-field optical microscopy (s-SNOM) based on continuous wave sources mostly relies on cryogenic and bulky detectors, which represents a major constraint for its practical application. Here, we devise a THz s-SNOM system that provides both amplitude and phase contrast and achieves nanoscale (60-70nm) in-plane spatial resolution. It features a quantum cascade laser that simultaneously emits THz frequency light and senses the backscattered optical field through a voltage modulation induced inherently through the self-mixing technique. We demonstrate its performance by probing a phonon-polariton-resonant CsBr crystal and doped black phosphorus flakes.
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