Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces

Nano surfaces offer exciting opportunities to implement novel technologies. With their help, surfaces can be created that are very suitable as a reflection-absorbing layer. In order to be able to determine the degree of reflection and to compare it with the current methods of anti-reflection coating, a measuring system was developed which can measure the degree of reflection hemispherically. Furthermore, a simulation model was developed with which the behavior of the nano-surfaces can be examined with different parameters.