润湿
钝化
材料科学
基质(水族馆)
表面能
电荷(物理)
接口(物质)
理论(学习稳定性)
原子物理学
纳米技术
物理
复合材料
计算机科学
坐滴法
地质学
机器学习
海洋学
量子力学
图层(电子)
作者
Sreejith Pallikkara Chandrasekharan,Ida Lucci,D. C. Gupta,Charles Cornet,Laurent Pèdesseau
出处
期刊:Physical review
[American Physical Society]
日期:2023-08-21
卷期号:108 (7)
被引量:5
标识
DOI:10.1103/physrevb.108.075305
摘要
Here, we quantitatively determine the impact of III-V/Si interface atomic configuration on the wetting properties of the system. Based on a description at the atomic scale using density functional theory, we first show that it is possible to determine the absolute interface energies in heterogeneous materials systems. A large variety of absolute GaP surface energies and GaP/Si interface energies are then computed, confirming the large stability of charge compensated III-V/Si interfaces with an energy as low as 23 meV/\r{A}$^{2}$. While stable compensated III-V/Si interfaces are expected to promote complete wetting conditions, it is found that this can be easily counterbalanced by the substrate initial passivation, which favors partial wetting conditions.
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