显微镜
光学
计算机科学
波长
光学显微镜
显微镜
材料科学
物理
扫描电子显微镜
作者
Jacob A. Sacks,Holger Muenz,Julie Bentley
摘要
New secondary axial color aberration theory has enabled powerful tools in the analysis of optical systems. Using these tools, design principles of a microscope objective operating over visible wavelengths are explored.
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