过程(计算)
制造工程
生产(经济)
新产品开发
产品(数学)
计算机科学
半导体器件制造
过程开发执行系统
制造业
学习曲线
先进制造业
业务
过程管理
工程类
营销
经济
电气工程
薄脆饼
几何学
数学
宏观经济学
操作系统
作者
Nile W. Hatch,David C. Mowery
出处
期刊:Management Science
[Institute for Operations Research and the Management Sciences]
日期:1998-11-01
卷期号:44 (11-part-1): 1461-1477
被引量:380
标识
DOI:10.1287/mnsc.44.11.1461
摘要
This paper analyzes the relationship between process innovation and learning by doing in the semiconductor industry where improvements in manufacturing yield are a catalyst for dynamic cost reductions. In contrast to most previous studies of learning by doing, the learning curve is shown here to be the product of deliberate activities intended to improve yields and reduce costs, rather than the incidental byproduct of production volume. Since some of the knowledge acquired through learning by doing during new process development is specific to the production environment where the process is developed, some knowledge is effectively lost when a new process is transferred to manufacturing. We find that dedicated process development facilities, geographic proximity between development and manufacturing facilities, and the duplication of equipment between development and manufacturing facilities are all significant in improving performance in introducing new technologies. Once in manufacturing, new processes are shown to disrupt the ongoing learning activities of existing processes by drawing away scarce engineering resources to “debug” the new processes.
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