沟槽
机制(生物学)
MOSFET
雪崩击穿
电击穿
材料科学
光电子学
击穿电压
电气工程
物理
工程类
纳米技术
电压
晶体管
电介质
图层(电子)
量子力学
作者
Jing An,Cailin Wang,Jiaxuan He,J. L. Zhang
标识
DOI:10.1109/isset62871.2024.10779720
摘要
The termination structure of SGT MOSFET is related to the breakdown voltage and avalanche ruggedness. The trench termination is introduced into SGT MOSFET, and the breakdown mechanism and dynamic avalanche are studied and analyzed in this paper, which can optimize the distribution of electric field strength at the termination region, improve the voltage withstand stability and avalanche ruggedness of SGT MOSFET.
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