电池(电)
纳米技术
材料科学
工程物理
计算机科学
物理
功率(物理)
热力学
作者
Keyue Liang,Xintong Yuan,Xin Chen,Bo Liu,Jung Tae Kim∥,Jiayi Joey Yu,Dingyi Zhao,Yuzhang Li
出处
期刊:Nano Letters
[American Chemical Society]
日期:2025-04-22
卷期号:25 (18): 7210-7223
被引量:3
标识
DOI:10.1021/acs.nanolett.5c00740
摘要
Cryogenic electron microscopy (cryo-EM) has shown great promise in preserving and characterizing beam-sensitive battery materials and interfaces at atomic resolution. With the growing interest in adopting cryo-EM for battery research, this review provides detailed and practical guidance for researchers on cryo-EM workflows including sample preparation and transfer, imaging, data acquisition, and analysis. Strategies for minimizing artifacts during sample preparation and imaging processes are discussed along with approaches to address potential pitfalls in data analysis to ensure accurate interpretation. Finally, this review explores the challenges and opportunities for advancing the cryo-EM technique to further enhance its impact on future developments in battery research.
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