系统间交叉
有机发光二极管
材料科学
磷光
费斯特共振能量转移
光电子学
荧光
量子效率
二极管
激子
准分子
摩尔吸收率
能量转移
辐射能
光电二极管
光化学
作者
Odugu Pavan Kumar,Nisha Vergineya S,Meghana Tirupati,Aradhya Rajput,Jang Hyuk Kwon
出处
期刊:Small
[Wiley]
日期:2026-08-22
卷期号:: e75361-e75361
摘要
ABSTRACT Multi‐resonance thermally activated delayed fluorescence (MR‐TADF) emitters have gained considerable attention to solve the color purity issue in organic light‐emitting diode (OLED) commercialization. However, their slow reverse intersystem crossing rate (k RISC ) leads to the severe efficiency roll‐off and reduced operational stability. To address this limitation, phosphorescence‐sensitized fluorescence (PSF) technology has been widely adopted. Nevertheless, the external quantum efficiency (EQE) of PSF OLED is relatively low compared to TADF‐sensitized fluorescence (TSF) OLED, where the relatively low radiative rate (k r ) (∼10 5 – 10 6 s −1 ) of phosphorescence sensitizer (PS) limits the Forster resonance energy transfer (FRET) rate and exciton utilization in PSF OLEDs. This review, describes the techniques to improve the FRET rate by optimizing the physical parameters related to it. From the analysis, the FRET rate of the PSF OLEDs can be enhanced by improving the terminal emitters' (TE's) extinction coefficient (ε) and a large spectral overlap (J) with PS emission. Further, utilizing the dual‐channel energy transfer process, combined with high T 1 exciplex host system to suppress the back energy transfer (BET) from PS to the host, resulting in high EQE. Furthermore, the stability of the PSF OLED can be improved by the utilization of a highly stable intrinsic ET‐type host, and TE materials.
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