Electron- and X-Ray-Diffraction Study of Cesium Antimonide Films Deposited on MnO and Other Substrates

Electron-diffraction data obtained from cesium antimonide cathodes deposited on oxidized manganese are consistent with a composite layer structure of Cs3Sb and MnO in which no appreciable chemical reaction occurs. In constrast, the low sensitivity cathodes obtained on unoxidized manganese can be attributed to the formation of MnSb when antimony is deposited. No change in the diffraction pattern of Cs3Sb is observed when the cathode is superficially oxidized as would be expected if only surface oxidation takes place. Direct evidence was also obtained for essentially complete order in annealed samples of Cs3Sb by x-ray diffraction. Although diffraction lines, indicative of order, were observed in the electron diffraction patterns of some simple Cs3Sb cathodes, their presence could not be correlated with any changes in photoelectric sensitivity.