材料科学
开尔文探针力显微镜
欧姆接触
兴奋剂
脉冲激光沉积
分析化学(期刊)
X射线光电子能谱
薄膜
掺杂剂
工作职能
扫描电子显微镜
锌
肖特基二极管
伏打电位
光电子学
纳米技术
化学工程
二极管
原子力显微镜
冶金
复合材料
化学
图层(电子)
色谱法
工程类
作者
Amit Kumar,Tun Seng Herng,Kaiyang Zeng,Jun Ding
摘要
The bipolar charge phenomenon in Cu and Co co-doped zinc oxide (ZnO) film samples has been studied using scanning probe microscopy (SPM) techniques. Those ZnO samples are made using a pulsed laser deposition (PLD) technique. It is found that the addition of Cu and Co dopants suppresses the electron density in ZnO and causes a significant change in the work function (Fermi level) value of the ZnO film; this results in the ohmic nature of the contact between the electrode (probe tip) and codoped sample, whereas this contact exhibits a Schottky nature in the undoped and single-element-doped samples. These results are verified by Kelvin probe force microscopy (KPFM) and ultraviolet photoelectron spectroscopy (UPS) measurements. It is also found that the co-doping (Cu and Co) can stabilize the bipolar charge, whereas Cu doping only stabilizes the positive charge in ZnO thin films.
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