千分尺
化学
整改
聚电解质
电解质
纳米技术
图层(电子)
纳米尺度
离子流
分析化学(期刊)
化学物理
离子
光学
材料科学
色谱法
电极
物理化学
热力学
物理
有机化学
功率(物理)
聚合物
作者
Xiulan He,Kailin Zhang,Ting Li,Yanan Jiang,Ping Yu,Lanqun Mao
摘要
Here we report for the first time that ion current rectification (ICR) can be observed at the micrometer scale in symmetric electrolyte solution with polyimidazolium brush (PimB)-modified micropipets, which we call micrometer-scale ion current rectification (MICR). To qualitatively understand MICR, a three-layer model including a charged layer, an electrical double layer, and a bulk layer is proposed, which could also be extended to understanding ICR at the nanoscale. Based on this model, we propose that when charges in the charged layer are comparable with those in the bulk layer, ICR would occur regardless of whether the electrical double layers are overlapped. Finite element simulations based on the solution of Poisson and Nernst-Planck equations and in situ confocal laser scanning microscopy results qualitatively validate the experimental observations and the proposed three-layer model. Moreover, possible factors influencing MICR, including the length of PimB, electrolyte concentration, and the radius of the pipet, are investigated and discussed. This study successfully extends ICR to the micrometer scale and thus opens a new door to the development of ICR-based devices by taking advantage of ease-in-manipulation and designable surface chemistry of micropipets.
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