航空电子设备
可靠性(半导体)
焊接
数码产品
可靠性工程
领域(数学)
飞机
电子包装
机械工程
工程类
陶瓷
计算机科学
航空航天工程
材料科学
电气工程
物理
量子力学
复合材料
功率(物理)
纯数学
数学
作者
Kevin Cluff,Daniel Robbins,Tom Edwards,Donald E. Barker
出处
期刊:Journal of the IES
[Institute of Environmental Sciencs and Technology (IEST)]
日期:1997-07-31
卷期号:40 (4): 22-28
被引量:22
标识
DOI:10.17764/jiet.2.40.4.pw91683217088168
摘要
Defining environmental loading is often the most uncertain part of the electronics reliability calculation. This paper demonstrates a practical methodology to measure and characterize the dynamic thermal history of the commercial airplane environment. To reduce irregular field thermal cycles, an algorithm is presented that preserves key information necessary for viscoplastic solder fatigue analysis. As an example. the IPC solder model will be used to evaluate 20 termination leadless ceramic chip carriers on nonconstrained printed wiring boards. This methodology will enable more realistic thermal fatigue reliability assessments and acceleration test specifications.
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