润湿
接触角
千分尺
化学
干涉显微镜
光学
粘度
薄脆饼
硅
分辨率(逻辑)
微分干涉显微术
显微镜
纳米
纳米技术
材料科学
复合材料
物理
有机化学
人工智能
计算机科学
作者
Masanobu Kawamoto,Shu‐hei Urashima,Motohiro Banno,Hiroharu Yui
标识
DOI:10.1007/s44211-023-00342-4
摘要
While static wettability is well treated with Young's equation via its static contact angle, theoretical analyses for wetting dynamics are not yet reaching consensus due to a singularity of the spreading forces worked at the vapor/liquid/solid contact line. One plausible explanation to overcome the singularity problem is that there is a so-called precursor film spreading outside the apparent contact line. After its first finding in 1919, many researchers have attempted to visualize its shape. However, because its length and thickness are as small as micrometer and nanometer-order, respectively, its visualization still remains a challenging issue especially for low-viscosity liquids. In the present study, we developed a differential laser interference microscope, which has a thickness resolution of approximately 2 nm at the best, and applied it to the wetting front of 10 cSt of silicone oil spreading on a silicon wafer with an almost constant spreading velocity. As a result, the precursor film of 14 µm long and 108 nm thick was clearly visualized. While the macro contact line has a finite advancing contact angle of 4.0°, the gradient of the precursor film surface gradually decreased and converged to ~ 0.1° at the micro-contact angle. The shape of the precursor film was independent of the time after the dropping for the range of 600 s ± 10%, which is consistent to theoretical estimation. The present study demonstrated that our interferometer simultaneously achieved nanometer thickness resolutions, micrometer in-plane spatial resolution, and at least a millisecond temporal resolution with a simple optical setup.
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