Dark count probability and quantum efficiency of avalanche photodiodes for single-photon detection
作者
Yunlu Kang,Haitao Lu,Yu‐Hwa Lo,Donald S. Bethune,W. P. Risk
出处
期刊:Applied Physics Letters [American Institute of Physics] 日期:2003-10-03卷期号:83 (14): 2955-2957被引量:141
标识
DOI:10.1063/1.1616666
摘要
We propose a physical model that quantitatively describes the behavior of the dark count probability and single-photon quantum efficiency of avalanche diodes under conditions that allow these devices to be used for single-photon detection. The model shows analytically how various physical parameters such as dark current, dc gain, Geiger mode gain, carrier detrap time, pulse repetition rate, etc., can affect the dark count probability and single-photon quantum efficiency of a Geiger mode avalanche photodiode. The theory agrees well with the experimental results.