无杂散动态范围
逐次逼近ADC
电容器
电子工程
动态范围
CMOS芯片
计算机科学
积分非线性
电气工程
转换器
电压
电容
物理
工程类
电极
量子力学
作者
Eric Swindlehurst,Hunter Jensen,Alexander Petrie,Yixin Song,Yen‐Cheng Kuan,Yong Qu,Mau-Chung Frank Chang,Jieh-Tsorng Wu,Shiuh-Hua Wood Chiang
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2021-02-22
卷期号:56 (8): 2347-2359
被引量:15
标识
DOI:10.1109/jssc.2021.3057372
摘要
An 8-bit 10-GHz 8 × time-interleaved successive-approximation-register (SAR) analog-to-digital converter (ADC) incorporates an aggressively scaled digital-to-analog converter (DAC) with grouped capacitors in a symmetrical structure to afford a threefold reduction in the bottom-plate parasitic capacitance. A detailed study rigorously analyzes the effect of gradient on the proposed DAC layout. The DAC additionally implements quantized sub-radix-2 scaling with redistributed redundancy. A high-speed dual-path bootstrapped switch decouples the critical signal from the nonlinear parasitic capacitance to boost the sampling spurious-free dynamic range (SFDR) by more than 5 dB. Fabricated in a 28-nm CMOS process, the ADC demonstrates an SNDR of 36.9 dB at Nyquist while consuming 21 mW, yielding a figure-of-merit of 37 fJ/conv.-step, the best among state-of-the-arts.
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