等离子体子
显微镜
材料科学
干涉测量
表面等离子共振
纳米尺度
光学
折射率
相(物质)
表面等离子体子
纳米光子学
表征(材料科学)
近场扫描光学显微镜
纳米技术
光学显微镜
光电子学
纳米颗粒
扫描电子显微镜
化学
物理
有机化学
复合材料
作者
Yuting Yang,Chunhui Zhai,Qiang Zeng,Ab Lateef Khan,Hui Yu
出处
期刊:ACS Nano
[American Chemical Society]
日期:2019-11-07
卷期号:13 (11): 13595-13601
被引量:38
标识
DOI:10.1021/acsnano.9b08259
摘要
Plasmonic microscopy is a powerful tool for nanoscopic bio- and chemical sample analysis due to its high sensitivity. Phase quantification in plasmonic microscopy would provide inherent information, i.e., refractive index, for identification of nanomaterials. However, it usually relies on complex optics to acquire quantitative phase images. Here, we demonstrated the quantitative amplitude and phase imaging capabilities through holographical reconstructions of the plasmonic patterns recorded in the interferometric plasmonic microscopy. Operating the plasmonic microscopy over the surface plasmon resonance angle separates the twin images and allows for accurate mapping of the amplitude and phase distribution of surface plasmon near fields. Results show that the imaging capabilities enable direct visualization of complex surface plasmon fields arising from interactions with nanoparticles and nanowires, without the need for nanoscopic scanning probes. Theoretical and experimental analysis also suggests future applications in the identification of nanoparticles and super-resolution imaging. The proposed technology is thus promising for nanoplasmonic study and various sensing purposes.
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